Thermodynamics Research Center / ThermoML | Thermochimica Acta

Formation of Ba(1-x)CaxTiO3 solid solutions beyond the solubility limit by 'sputter-anneal' method

Ako, M.[Miho], Kogure, T.[Takeshi], Kobayashi, Y.[Yumie], Kyomen, T.[Toru], Fujisawa, J.-i.[Jun-ichi], Hanaya, M.[Minoru]
Thermochim. Acta 2019, 679, 178339
ABSTRACT
To produce Ba1-xCaxTiO3 solid solutions beyond the solubility limit, we performed rf magnetron sputtering using the targets of (BaTiO3)1-x(CaTiO3)x with compositions x from 0 to 1 onto quartz glass substrates without heating the substrates and annealed the formed film samples. The as-prepared film samples by the sputtering were confirmed to have amorphous structures. By annealing the as-prepared amorphous film samples at the rather low temperature of 800 deg C for 3 h, crystallization proceeded in the samples, and we successfully obtained Ba1-xCaxTiO3 solid solutions in whole the composition range without phase separation. The permittivity of the formed solid solutions exhibited a peculiar Ca composition dependence. The dependence was well explained by the formation of extra space around Ca2+ ions substituted for Ba2+ ions.
Compounds
# Formula Name
1 CaO3Ti calcium titanium(IV) oxide
2 BaO3Ti barium titanium(IV) oxide
Datasets
The table above is generated from the ThermoML associated json file (link above). POMD and RXND refer to PureOrMixture and Reaction Datasets. The compound numbers are included in properties, variables, and phases, if specificied; the numbers refer to the table of compounds on the left.
Type Compound-# Property Variable Constraint Phase Method #Points
  • POMD
  • 1
  • Relative permittivity at various frequencies ; Crystal
  • Pressure, kPa; Crystal
  • Temperature, K; Crystal
  • Frequency, MHz; Crystal
  • Crystal
  • impedance analyzer Solartron, SI1260
  • 1
  • POMD
  • 1
  • Mass density, kg/m3 ; Crystal
  • Pressure, kPa; Crystal
  • Temperature, K; Crystal
  • Crystal
  • X-ray diffraction
  • 1
  • POMD
  • 2
  • Relative permittivity at various frequencies ; Crystal
  • Pressure, kPa; Crystal
  • Temperature, K; Crystal
  • Frequency, MHz; Crystal
  • Crystal
  • impedance analyzer Solartron, SI1260
  • 1
  • POMD
  • 2
  • Mass density, kg/m3 ; Crystal
  • Pressure, kPa; Crystal
  • Temperature, K; Crystal
  • Crystal
  • X-ray diffraction
  • 1
  • POMD
  • 1
  • 2
  • Relative permittivity at various frequencies ; Crystal
  • Mole fraction - 1; Crystal
  • Pressure, kPa; Crystal
  • Temperature, K; Crystal
  • Frequency, MHz; Crystal
  • Crystal
  • impedance analyzer Solartron, SI1260
  • 7
  • POMD
  • 1
  • 2
  • Mass density, kg/m3 ; Crystal
  • Mole fraction - 1; Crystal
  • Pressure, kPa; Crystal
  • Temperature, K; Crystal
  • Crystal
  • X-ray diffraction
  • 7